LayTec, a major provider of in-situ optical metrology systems for thin-film processes, wins the Aurora Award 2012 under the category of The Best LED Test Equipment to honor its outstanding product for the LED industry.
 
The award-winning product is Pyro 400, LayTec’s in-situ solution for precise measurement of GaN real surface temperature during epitaxial growth process. This near-UV pyrometry tool provides a new quality of temperature control with an unrivalled accuracy and is of huge benefit in GaN based LED and laser production because it directly correlates with the final devices emission wavelength. Pyro 400 can be combined with other LayTec in-situ monitoring systems for simultaneous measurements of GaN surface temperature with pocket temperature, reflectance and wafer curvature.
 
Thomas Zettler, LayTec´s CEO & president, stated: “We are very proud that Pyro 400, our surface temperature measurement tool for GaN epitaxy, received the Aurora prize in the test equipment category. On behalf of the whole LayTec team, I would like to thank all our customers who voted online for our product and the international prize committee for their decision that LayTec´s latest product deserves this honor!”